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A new model for the negative voltage instability in MOS devices
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10.1063/1.88085
/content/aip/journal/apl/26/3/10.1063/1.88085
http://aip.metastore.ingenta.com/content/aip/journal/apl/26/3/10.1063/1.88085
/content/aip/journal/apl/26/3/10.1063/1.88085
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/content/aip/journal/apl/26/3/10.1063/1.88085
2008-09-02
2014-12-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A new model for the negative voltage instability in MOS devices
http://aip.metastore.ingenta.com/content/aip/journal/apl/26/3/10.1063/1.88085
10.1063/1.88085
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