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X‐ray topographic study of dark‐spot defects in GaAs‐Ga1−x Al x As double‐heterostructure wafers
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10.1063/1.88430
/content/aip/journal/apl/27/4/10.1063/1.88430
http://aip.metastore.ingenta.com/content/aip/journal/apl/27/4/10.1063/1.88430
/content/aip/journal/apl/27/4/10.1063/1.88430
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/content/aip/journal/apl/27/4/10.1063/1.88430
2008-09-02
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X‐ray topographic study of dark‐spot defects in GaAs‐Ga1−xAlxAs double‐heterostructure wafers
http://aip.metastore.ingenta.com/content/aip/journal/apl/27/4/10.1063/1.88430
10.1063/1.88430
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