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Deep trap measurement on S+‐implanted layers in GaAs
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10.1063/1.88777
/content/aip/journal/apl/28/7/10.1063/1.88777
http://aip.metastore.ingenta.com/content/aip/journal/apl/28/7/10.1063/1.88777
/content/aip/journal/apl/28/7/10.1063/1.88777
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/content/aip/journal/apl/28/7/10.1063/1.88777
2008-08-28
2014-12-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Deep trap measurement on S+‐implanted layers in GaAs
http://aip.metastore.ingenta.com/content/aip/journal/apl/28/7/10.1063/1.88777
10.1063/1.88777
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