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Optical studies of the back‐channel leakage in N‐channel MOSFET on silicon‐on‐sapphire (SOS)
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10.1063/1.88882
/content/aip/journal/apl/29/1/10.1063/1.88882
http://aip.metastore.ingenta.com/content/aip/journal/apl/29/1/10.1063/1.88882
/content/aip/journal/apl/29/1/10.1063/1.88882
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/content/aip/journal/apl/29/1/10.1063/1.88882
2008-08-28
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical studies of the back‐channel leakage in N‐channel MOSFET on silicon‐on‐sapphire (SOS)
http://aip.metastore.ingenta.com/content/aip/journal/apl/29/1/10.1063/1.88882
10.1063/1.88882
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