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Crater‐edge profiling in interface analysis employing ion‐beam etching and AES
1.J. S. Johannessen, W. E. Spicer, J. F. Gibbons, J. Plummer, and N. J. Taylor (unpublished).
2.J. S. Johannessen, W. E. Spicer, and Y. E. Strausser, J. Appl. Phys. 47, 3028 (1976).
3.C. C. Chang, Characterization of Solids Surfaces, edited by Kane and Larrabee (Plenum, New York, 1974), p. 509.
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