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Structure and initial oxidation of the LaB6 (001) surface
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8.The bias potential was applied in order to distinguish between secondary electrons from the sample and those from other parts, such as slits of the electron analyzer; the latter secondary electrons are excited by photoelectrons from the sample.
9.The work function for obtained here, is comparable to (Ref. 11) and [H. Yamaguehi, K. Takagi, I. Yuito, and U. Kawabe, Appl. Phys. Lett. 29, 638 (1976)] measured by the Richardson‐plot method and is slightly higher than (Ref. 11) obtained by the retarding‐potential method.
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