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Fast diffusion of elevated‐temperature ion‐implanted Se in GaAs as measured by secondary ion mass spectrometry
1.M. Takai, K. Gamo, K. Masuda, and S. Namba, Jpn. J. Appl. Phys. 12, 1926 (1973).
2.A. Lidow, J. F. Gibbons, and T. Magee, Appl. Phys. Lett. 31, 158 (1977).
3.P. Williams, R. K. Lewis, C. A. Evans, Jr., and P. R. Harley, Anal. Chem. 49, 1399 (1977).
4.P. Williams and C. A. Evans, Jr., Appl. Phys. Lett. 30, 559 (1977).
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