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Far‐infrared emission from Si‐MOSFET’s on high‐index surfaces
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10.1063/1.90047
/content/aip/journal/apl/32/6/10.1063/1.90047
http://aip.metastore.ingenta.com/content/aip/journal/apl/32/6/10.1063/1.90047
/content/aip/journal/apl/32/6/10.1063/1.90047
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/content/aip/journal/apl/32/6/10.1063/1.90047
2008-08-08
2014-09-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Far‐infrared emission from Si‐MOSFET’s on high‐index surfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/32/6/10.1063/1.90047
10.1063/1.90047
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