No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Laser annealing of diffusion‐induced imperfections in silicon
1.M. L. Yoshi and F. Wilhelm, J. Electrochem. Soc. 112, 185 (1965).
2.P. F. Schmidt and R. Stickler, J. Electrochem. Soc. 111, 1188 (1964).
3.R. A. McDonald, G. G. Ehlenberger, and T. R. Huffman, Solid State Electron. 9, 807 (1966).
4.J. Lindmayer and J. F. Allison, Conference Record of the Ninth IEEE Photovoltaic Specialists Conference, Silver Spring, Md., 1972, p. 66 (unpublished).
5.R. K. Jain and R. J. Van Overstraeten, J. Appl. Phys. 44, 2437 (1973).
6.J. C. Wang and R. F. Wood, Bull. Am. Phys. Soc. (to be published).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month