Identification of oxide precipitates in annealed silicon crystals
1.J. R. Patel, Discuss. Faraday Soc. 38, 201 (1964).
2.T. Y. Tan and W. K. Tice, Philos. Mag. 30, 15 (1976).
3.D. M. Maher, A. Standinger, and J. R. Patel, J. Appl. Phys. 47, 3813 (1976).
4.G. H. Schwuttke and K. H. Yang, Technical Report No. 2, ARPA Contract No. N00 173‐76‐C‐0303, 1977 (unpublished).
5.R. F. Egerton, C. J. Rossouw, and M. J. Whelan, Developments in Electron Microscopy and Analysis, edited by J. A. Venables (Academic, New York, 1976), p. 129.
6.S. I. Raider and R. Flitsh, J. Electrochem. Soc. 123, 1756 (1976).
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