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Edge effect in high‐resolution scanning Auger‐electron microscopy
1.R. L. Gerlach and N. C. MacDonald, SEM, Vol. I (IITRI, Chicago, 1976), pp. 199–206.
2.N. C. MacDonald, R. L. Gerlach, C. T. Hovland, and R. Shimizu, Proceedings of the 7th International Vacuum Congress and the 3rd International Conference on Solid Surfaces (Vienna 1977), p. A‐2751 (unpublished).
3.G. D. Archard, J. Appl. Phys. 32, 1505 (1961).
4.R. Shimizu, M. Aratama, S. Ichimura, and Y. Yamazaki, Appl. Phys. Lett. 31, 692 (1977).
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