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A comparison of surface analysis using ion scattering, ion‐produced photons, and secondary ion emission
1.References here are too numerous to list. The reader is referred to proceedings of conferences on Ion Beam‐Characterisation of Surfaces, such as those held at Karlsruhe (1975) and Washington (1977).
2.R. J. MacDonald and P. J. Martin, Surf. Sci. 67, 237 (1977).
3.M. Grundner, W. Heiland, and E. Taglauer, Appl. Phys. 4, 243 (1974).
4.G. Blaise, Surf. Sci. 60, 65 (1976).
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6.W. Englert, W. Heiland, and E. Taglauer, Verh. Dtsch. Ges. Pathol. 2, 592 (1978).
7.E. Taglauer, G. Marin, and W. Heiland, Appl. Phys. 13, 47 (1977).
8.E. Taglauer, U. Beitat, and W. Heiland, Presented at 3rd Int. Conf. on Ion Beam Analysis, Washington, 1977 (unpublished).
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