Full text loading...
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Chemical effect in (LVV) Auger spectra of third‐period elements (Al, Si, P, and S) dissolved in copper
1.K. Terakura, J. Phys. Soc. Jpn. 40, 450 (1976).
2.K. Tanaka and A. Hiraki, Proc. Intern. Conf. X‐ray and XUV Spectroscopy, Sendai, Japan, 1978 (unpublished).
3.K. Tanaka, M. Matsumoto, S. Maruno, and A. Hiraki, Appl. Phys. Lett. 27, 529 (1975).
4.In the overall Auger spectra from Cu‐Al, the Cu (MVV) signals at the 60‐ and the 64‐eV peaks of the Al signal almost overlap. Then, we prepared a alloy and observed the increase in peaks at both 64 and 68 eV and the decrease in the 60‐eV peak to confirm that in the alloy the Al signal has the double peaks at 64 and 68 eV, as described in the text.
5.M. Iwami, S. Kim, I. Matsuo, and A. Hiraki, J. Cryst. Growth (to be published).
6.A similar chemical effect has been observed in the alloys of Si‐Pd and P‐Pd —the LVV spectra of both Si and P have similar structure—and was also employed for the study of the interface of Pd (film)‐Si (substrate) and Pd (film)‐GaP (substrate) systems as shown in Ref. 7.
7.A. Hiraki, S. Kim, W. Kammura, and M. Iwami, Surf. Sci. (to be published).
Article metrics loading...