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SAW dispersion and film‐thickness measurement by acoustic microscopy
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10.1063/1.91099
/content/aip/journal/apl/35/3/10.1063/1.91099
http://aip.metastore.ingenta.com/content/aip/journal/apl/35/3/10.1063/1.91099
/content/aip/journal/apl/35/3/10.1063/1.91099
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/content/aip/journal/apl/35/3/10.1063/1.91099
2008-08-07
2014-07-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: SAW dispersion and film‐thickness measurement by acoustic microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/35/3/10.1063/1.91099
10.1063/1.91099
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