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Low temperature recombination lifetime in Si metal oxide semiconductor field effect transistors
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10.1063/1.92644
/content/aip/journal/apl/39/2/10.1063/1.92644
http://aip.metastore.ingenta.com/content/aip/journal/apl/39/2/10.1063/1.92644
/content/aip/journal/apl/39/2/10.1063/1.92644
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/content/aip/journal/apl/39/2/10.1063/1.92644
1981-07-15
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low temperature recombination lifetime in Si metal oxide semiconductor field effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/39/2/10.1063/1.92644
10.1063/1.92644
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