No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Imaging performance of a normal incidence soft x‐ray telescope
1.E. Spiller, A. Segmuller, J. Rife, and R. P. Haelbich, Appl. Phys. Lett. 37, 1048 (1980);
1.T. W. Barbee, in Proceedings of Topical Conference on Low Energy X‐ray Diagnostics, Monterey, California, June 8–10, 1981 (to be published).
2.Manufactured by the Zygo Corporation, Middlefield, Connecticutt.
3.J. P. Henry, E. M. Kellogg, U. G. Briel, S. S. Murray, L. P. Van Speybroeck, and P. J. Bjorkholm, SPIE Proceedings 106, 196 (1977).
4.W. J. Smith, Modern Optical Engineering (McGraw‐Hill, New York, 1966).
5.L. P. Van Speybroeck, SPIE Proceedings 184, 2 (1979).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month