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Change of interface state spectrum in Al/SiO2/Si structures with biasing during electron irradiation
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10.1063/1.93194
/content/aip/journal/apl/40/7/10.1063/1.93194
http://aip.metastore.ingenta.com/content/aip/journal/apl/40/7/10.1063/1.93194
/content/aip/journal/apl/40/7/10.1063/1.93194
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/content/aip/journal/apl/40/7/10.1063/1.93194
1982-04-01
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Change of interface state spectrum in Al/SiO2/Si structures with biasing during electron irradiation
http://aip.metastore.ingenta.com/content/aip/journal/apl/40/7/10.1063/1.93194
10.1063/1.93194
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