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Parameter fluctuations and low frequency noise in Josephson junction devices
1.R. F. Voss and J. Clarke, Phys. Rev. B 13, 556 (1976).
2.J. Clarke and G. Hawkins, Phys. Rev. B 14, 2826 (1976).
3.L. Krusin‐Elbaum and R. F. Voss, Proc. of the Sixth Intl. Conf. on Noise in Physical Systems, Gaithersburg, Md. 1981.
4.M. Ketchen and C. C. Tsuei, Proc. of the 2nd Int. Conf. on Superconducting Devices, Berlin 1980.
5.R. C. Jaklevic, J. Lambe, A. H. Silver, and J. Mercereau, Phys. Rev. Lett. 12, 159 (1964);
5.R. C. Jaklevic, J. Lambe, A. H. Silver, and J. Mercereau, Phys. Rev. Lett. 14, 887 (1965);
5.R. C. Jaklevic, J. Lambe, A. H. Silver, and J. Mercereau, Phys. Rev. 140, A1628 (1965).
6.C. D. Tesche, J. Low Temp. Phys. 44, 119 (1981).
7.R. P. Giffard, Proc. of the Second Intl. Conf. on Superconducting Devices, Berlin, 1980.
8.M. Horowitz, A. A. Silvidi, S. F. Malaker, and J. G. Daunt, Phys. Rev. 88, 1182 (1952).
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