Full text loading...
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
High‐speed ultraviolet and x‐ray‐sensitive InP photoconductive detectors
1.A. G. Foyt, F. J. Leonberger, and R. C. Williamson, Appl. Phys. Lett. 40, 447 (1982) and references therein.
2.R. B. Hammond, N. G. Paulter, A. E. Iverson, and R. C. Smith, Technical Digest of International Electron Devices Meeting, Washington, D.C., 1981, p. 157.
3.B. O. Seraphim and H. E. Bennett, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1967), Vol. 3, pp. 529–530.
4.W. J. Veigle, At. Data Tables 5, 51 (1973).
5.B. W. Batterman and N. W. Ashcroft, Science 206, 157 (1979).
6.R. H. Day, P. Lee, E. B. Soloman, and D. J. Nagel, Los Alamos Scientific Laboratory Report LA‐7941‐MS, February, 1981.
7.D. T. Attwood, R. L. Kaufman, G. L. Stradling, K. L. Medecki, R. A. Lerche, L. W. Coleman, E. L. Pierce, S. W. Thomas, D. E. Campbell, J. Noonan, G. R. Tripp, R. J. Schnetz, and G. E. Phillips, XIV International Congress on High Speed Photography and Photonics, Moscow, USSR, Oct., 1980, and Lawrence Livermore Laboratory Report UCRL‐85043.
8.P. B. Lyons, in Low Energy X‐ray Diagnostics, edited by D. T. Atwood and B. L. Henke, AIP Proceeding No. 75 (AIP, New York, 1981), p. 59.
9.C. J. Wu and D. B. Wittry, J. Appl. Phys. 49, 2827 (1978).
Article metrics loading...