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Characterization of damage in ion implanted Ge
1.Ion implantation in Semiconductors, edited by J. W. Mayer, L. Erikksson, and J. A. Davies (Academic, New York, 1970).
2.Ion Implantation in Semiconductors, edited by I. Ruge and J. Granl (Springer, Berlin, 1971).
3.Ion Implantation in Semiconductors and Other Materials, edited by Billy L. Crowder (Plenum, New York, 1973).
4.Ion Implantation in Semiconductors, edited by F. Chernow, J. A. Borders, and D. K. Brice (Plenum, New York, 1976).
5.Proceedings of the Second International Conference on Ion Beam Modification of Materials, Nucl. Instrum. Methods 182/183 (1981).
6.Defects in Semiconductors, edited by J. Narayan and T. Y. Tan (North Holland, New York, 1981).
7.J. S. Williams, B. R. Appleton, K. T. Short, E. Lawson, O. W. Holland, and O. E. Schow III, submitted to the International Conference on Ion Beam Modification of Materials to be held in Grenoble, France, September 6, 1982.
8.B. R. Appleton, O. W. Holland, O. E. Schow III, C. W. White, J. S. Williams, K. T. Short, and E. Lawson (unpublished).
9.O. W. Holland, B. R. Appleton, J. Narayan, and O. E. Schow III (unpublished).
10.S. U. Campisano, M. G. Grimaldi, P. Baeri, G. Foti, and E. Rimini, Appl. Phys. Lett. 22, 201 (1980).
11.E. Rimini, P. Baeri, S. U. Campisano, and G. Foti, in Laser‐Solid Interactions and Laser Processing—1978, edited by S. D. Ferris, H. J. Leamy, and J. M. Poate (AIP, New York, 1979), p. 259.
12.N. G. E. Johansson, D. Sigurd, and K. Bjorkqvist, Rad. Eff. 6, 257 (1970).
13.J. Narayan, O. W. Holland, and B. R. Appleton (unpublished).
14.D. I. R. Norris, Rad. Eff. 14, 1 (1972).
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