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Relation between current‐voltage characteristics and interface states at metal‐semiconductor interfaces
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10.1063/1.93777
/content/aip/journal/apl/42/10/10.1063/1.93777
http://aip.metastore.ingenta.com/content/aip/journal/apl/42/10/10.1063/1.93777
/content/aip/journal/apl/42/10/10.1063/1.93777
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/content/aip/journal/apl/42/10/10.1063/1.93777
1983-05-15
2014-08-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Relation between current‐voltage characteristics and interface states at metal‐semiconductor interfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/42/10/10.1063/1.93777
10.1063/1.93777
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