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High near‐infrared reflectivity modulation with polycrystalline electrochromic WO3 films
1.W. C. Dautremont‐Smith, Displays 3, 67 (1982).
2.F. Wooten, Optical Properties of Solids (Academic, New York, 1972).
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6.We have also carried out a least squares fit for the thermally evaporated, post‐crystallized reflectivity data in Fig. 2 (dashed curve—taken) from Ref. 4, and it yielded and That is larger for the thermally evaporated film than for the sputter‐deposited film provides further evidence that the free‐electron scattering is strongly structure sensitive.
7.D. A. Mendelsohn, M.S. thesis, Tufts University, 1983 (unpublished).
8.T. S. Moss, G. J. Burrell, and B. Ellis, Semiconductor‐Optoelectronics (Butterworth, London, 1973).
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