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High resolution structural characterization of the amorphous‐crystalline interface in Se+‐implanted GaAs
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10.1063/1.94963
/content/aip/journal/apl/44/9/10.1063/1.94963
http://aip.metastore.ingenta.com/content/aip/journal/apl/44/9/10.1063/1.94963
/content/aip/journal/apl/44/9/10.1063/1.94963
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/content/aip/journal/apl/44/9/10.1063/1.94963
1984-05-01
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High resolution structural characterization of the amorphous‐crystalline interface in Se+‐implanted GaAs
http://aip.metastore.ingenta.com/content/aip/journal/apl/44/9/10.1063/1.94963
10.1063/1.94963
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