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X‐ray refractive index: A tool to determine the average composition in multilayer structures
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10.1063/1.96749
/content/aip/journal/apl/48/1/10.1063/1.96749
http://aip.metastore.ingenta.com/content/aip/journal/apl/48/1/10.1063/1.96749
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/content/aip/journal/apl/48/1/10.1063/1.96749
1986-01-06
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X‐ray refractive index: A tool to determine the average composition in multilayer structures
http://aip.metastore.ingenta.com/content/aip/journal/apl/48/1/10.1063/1.96749
10.1063/1.96749
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