1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Roles of shallow and deep electron traps causing backgating in GaAs metal‐semiconductor field‐effect transistors
Rent:
Rent this article for
USD
10.1063/1.96664
/content/aip/journal/apl/48/14/10.1063/1.96664
http://aip.metastore.ingenta.com/content/aip/journal/apl/48/14/10.1063/1.96664
/content/aip/journal/apl/48/14/10.1063/1.96664
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/48/14/10.1063/1.96664
1986-04-07
2014-08-01
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Roles of shallow and deep electron traps causing backgating in GaAs metal‐semiconductor field‐effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/48/14/10.1063/1.96664
10.1063/1.96664
SEARCH_EXPAND_ITEM