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Influence of oxide thickness on the transport properties of silicon metal‐oxide‐semiconductor systems
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10.1063/1.96524
/content/aip/journal/apl/48/6/10.1063/1.96524
http://aip.metastore.ingenta.com/content/aip/journal/apl/48/6/10.1063/1.96524
/content/aip/journal/apl/48/6/10.1063/1.96524
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/content/aip/journal/apl/48/6/10.1063/1.96524
1986-02-10
2014-10-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of oxide thickness on the transport properties of silicon metal‐oxide‐semiconductor systems
http://aip.metastore.ingenta.com/content/aip/journal/apl/48/6/10.1063/1.96524
10.1063/1.96524
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