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Study of deep level centers at excited states in GaP by means of transient optical absorption spectroscopy
1.J. C. Bourgion and M. Lanoo, Defects in Semiconductors (Springer, Berlin, 1980).
2.J. M. Spaeth and B. K. Meyer, Festkoerperprobleme 25, 613 (1985).
3.T. A. Kennedy and N. D. Wilsey, Phys. Rev. B 32, 6942 (1985).
4.H. P. Gislason, F. Rong, and G. D. Watkins, Phys. Rev. B 32, 6945 (1985).
5.T. N. Morgan, B. Welber, and R. N. Bhargava, Phys. Rev. 166, 751 (1968).
6.C. H. Henry, P. J. Dean, and J. D. Cuthbert, Phys. Rev. 166, 754 (1968).
7.H. P. Gislason, B. Monemar, M. E. Pistol, P. J. Dean, D. C. Herbert, A. Kana’ah, and B. C. Cavenett, Phys. Rev. B 31, 3774 (1985).
8.P. J. Dean, Physica B 117/118, 140 (1983).
9.Y. Dawei and B. C. Cavenett, J. Phys. C 17, 6367 (1984).
10.U. Kaufmann, J. Schneider, R. Worner, T. A. Kennedy, and N. D. Wilsey, J. Phys. C 14, L951 (1981).
11.B. K. Meyer and J. M. Spaeth, Phys. Rev. B 32, 1409 (1985).
12.B. K. Meyer, Th. Hangleiter, J. M. Spaeth, G. Strauch, Th. Zell, A. Winnacker, and R. H. Bartram, J. Phys. C 18, 1503 (1985).
13.Z. C. Newman, in Thirteenth International Conference on Defects in Semiconductors, edited by L. C. Kimerling and J. M. Parsey, Jr. (Metallurgical Society, Warrendale, 1985), p. 87.
14.N. Itoh, in Thirteenth International Conference on Defects in Semiconductors, edited by L. C. Kimerling and J. M. Parsey, Jr. (Metallurgical Society, Warrendale, 1985), p. 31.
15.M. Levinson, M. Stavola, J. L. Benton, and L. C. Kimerling, Phys. Rev. B 13, 5848 (1983).
16.M. Stavola, M. Levinson, J. L. Benton, and L. C. Kimerling, Phys. Rev. B 30, 832 (1984).
17.K. Tanimura and N. Itoh, J. Phys. Chem. Solids 45, 323 (1984).
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