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Determination of gap state density in polycrystalline silicon by field‐effect conductance
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10.1063/1.97460
/content/aip/journal/apl/49/16/10.1063/1.97460
http://aip.metastore.ingenta.com/content/aip/journal/apl/49/16/10.1063/1.97460
/content/aip/journal/apl/49/16/10.1063/1.97460
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/content/aip/journal/apl/49/16/10.1063/1.97460
1986-10-20
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of gap state density in polycrystalline silicon by field‐effect conductance
http://aip.metastore.ingenta.com/content/aip/journal/apl/49/16/10.1063/1.97460
10.1063/1.97460
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