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High‐resolution x‐ray diffraction and transmission electron microscopy studies of InGaAs/InP superlattices grown by gas‐source molecular beam epitaxy
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10.1063/1.97393
/content/aip/journal/apl/49/19/10.1063/1.97393
http://aip.metastore.ingenta.com/content/aip/journal/apl/49/19/10.1063/1.97393
/content/aip/journal/apl/49/19/10.1063/1.97393
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/content/aip/journal/apl/49/19/10.1063/1.97393
1986-11-10
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High‐resolution x‐ray diffraction and transmission electron microscopy studies of InGaAs/InP superlattices grown by gas‐source molecular beam epitaxy
http://aip.metastore.ingenta.com/content/aip/journal/apl/49/19/10.1063/1.97393
10.1063/1.97393
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