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Nondestructive characterization of multilayer structures by resonant attenuated total reflection spectroscopy
1.See, for example, N. J. Harrick Internal Reflection Spectroscopy (Wiley, New York, 1977).
2.A. Hjortsberg, W. P. Chen, and E. Burstein, Appl. Opt. 17, 430 (1978).
3.P. K. Tien and R. Ulrich, J. Opt. Soc. Am. 60, 1325 (1970).
4.T. Lopez‐Rios and G. Vuye, Surf. Sci. 81, 529 (1979).
5.B. Bosacchi and R. C. Oehrle, Appl. Opt. 21, 2167 (1982).
6.See, for example, P. H. Berning, in Physics of Thin Films, edited by G. Hass (Academic, New York, 1963), Vol. 1, p. 63.
7.See, for example, N. Ashby and S. C. Miller, J. Opt. Soc. Am. 67, 448 (1977).
8.J. E. Dennis, D. M. Gay, and R. E. Welsch, ACM Trans. Math. Software 7, 348 (1981).
9.W. M. Coughran, E. Grosse, and D. J. Rose, SIAM J. Stat. Comput. 7, 696 (1986).
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