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Reflectance‐difference spectroscopy system for real‐time measurements of crystal growth
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10.1063/1.99240
/content/aip/journal/apl/52/12/10.1063/1.99240
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/12/10.1063/1.99240
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/content/aip/journal/apl/52/12/10.1063/1.99240
1988-03-21
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reflectance‐difference spectroscopy system for real‐time measurements of crystal growth
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/12/10.1063/1.99240
10.1063/1.99240
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