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Single‐crystal x‐ray diffraction study of the InGaAs‐GaAsP/GaAs superlattice system
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10.1063/1.99174
/content/aip/journal/apl/52/15/10.1063/1.99174
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/15/10.1063/1.99174
/content/aip/journal/apl/52/15/10.1063/1.99174
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/content/aip/journal/apl/52/15/10.1063/1.99174
1988-04-11
2014-09-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Single‐crystal x‐ray diffraction study of the InGaAs‐GaAsP/GaAs superlattice system
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/15/10.1063/1.99174
10.1063/1.99174
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