1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Relationship between hole trapping and interface state generation in metal‐oxide‐silicon structures
Rent:
Rent this article for
USD
10.1063/1.99690
/content/aip/journal/apl/52/17/10.1063/1.99690
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/17/10.1063/1.99690
/content/aip/journal/apl/52/17/10.1063/1.99690
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/52/17/10.1063/1.99690
1988-04-25
2014-11-28
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Relationship between hole trapping and interface state generation in metal‐oxide‐silicon structures
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/17/10.1063/1.99690
10.1063/1.99690
SEARCH_EXPAND_ITEM