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Epitaxial Ge x Si1−x /Si (100) structures produced by pulsed laser mixing of evaporated Ge on Si (100) substrates
1.R. People, IEEE J. Quantum Electron. QE‐22, 1696 (1986).
2.G. Abstreiter, H. Brugger, T. Wolf, R. Zachai, and Ch. Zeller, in Two‐Dimensional Systems: Physics and New Devices, edited by G. Bauer, F. Kuchar, and H. Heinrich (Springer, New York, 1986), pp. 130–9.
3.J. C. Bean, L. C. Feldman, A. T. Fiory, S. Nakahara, and I. K. Robinson, J. Vac. Sci. Technol. A 2, 436 (1984).
4.C. M. Gronet, C. A. King, W. Opyd, J. F. Gibbons, S. D. Wilson, and R. Hull, J. Appl. Phys. 61, 2407 (1987).
5.P. G. Carey, T. W. Sigmon, R. L. Press, and T. S. Fahlen, IEEE Electron Device Lett. EDL‐6, 291 (1985).
6.P. G. Carey, K. Bezjian, T. W. Sigmon, P. Gildea, and T. J. Magee, IEEE Electron Device Lett. EDL‐7, 440 (1986).
7.T. W. Sigmon, in MRS Symposia Proceedings Volume 75: Photon, Beam and Plasma Stimulated Chemical Process at Surfaces (Materials Research Society, Pittsburgh, PA, 1987).
8.P. G. Carey, J. E. Turner, K. Nauka, G. A. Reid, and T. W. Sigmon, in MRS Symposia Proceedings Volume 92: Rapid Thermal Processing of Electronic Materials, edited by S. R. Wilson, R. Powell, and D. E. Davies (Materials Research Society, Pittsburgh, PA, 1987), pp. 65–70.
9.S. S. Lau, W. F. Tseng, I. Golecki, E. F. Kennedy, and J. W. Mayer, in Laser‐Solid Interactions and Laser Processing 1978, edited by S. D. Ferris, H. J. Leamy, and J. M. Poate (American Institute of Physics, New York, 1979), pp. 503–8.
10.I. Golecki, E. F. Kennedy, S. S. Lau, J. W. Mayer, W. F. Tseng, R. C. Eckardt, and R. J. Wagner, Thin Solid Films 57, L13 (1979).
11.H. J. Leamy, C. J. Doherty, K. C. R. Chiu, J. M. Poate, T. T. Sheng, and G. K. Celler, in Laser and Electron Beam Processing of Materials, edited by C. W. White and P. S. Peercy (Academic, New York, 1980), pp. 581–7.
12.J. C. Bravman and R. Sinclair, J. Electron Microsc. Tech. 1, 53 (1984).
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