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Deep level transient spectroscopy on single, isolated interface traps in field‐effect transistors
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10.1063/1.99388
/content/aip/journal/apl/52/8/10.1063/1.99388
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/8/10.1063/1.99388
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/content/aip/journal/apl/52/8/10.1063/1.99388
1988-02-22
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Deep level transient spectroscopy on single, isolated interface traps in field‐effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/52/8/10.1063/1.99388
10.1063/1.99388
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