1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Time‐resolved reflectivity techniques for dynamic studies of electron beam recrystallization of silicon‐on‐insulator films
Rent:
Rent this article for
USD
10.1063/1.100372
/content/aip/journal/apl/53/19/10.1063/1.100372
http://aip.metastore.ingenta.com/content/aip/journal/apl/53/19/10.1063/1.100372
/content/aip/journal/apl/53/19/10.1063/1.100372
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/53/19/10.1063/1.100372
1988-11-07
2014-12-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Time‐resolved reflectivity techniques for dynamic studies of electron beam recrystallization of silicon‐on‐insulator films
http://aip.metastore.ingenta.com/content/aip/journal/apl/53/19/10.1063/1.100372
10.1063/1.100372
SEARCH_EXPAND_ITEM