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Infrared characterization of UV laser‐induced silicon oxide films
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10.1063/1.100482
/content/aip/journal/apl/53/19/10.1063/1.100482
http://aip.metastore.ingenta.com/content/aip/journal/apl/53/19/10.1063/1.100482
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/content/aip/journal/apl/53/19/10.1063/1.100482
1988-11-07
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Infrared characterization of UV laser‐induced silicon oxide films
http://aip.metastore.ingenta.com/content/aip/journal/apl/53/19/10.1063/1.100482
10.1063/1.100482
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