1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
f
Erratum: Single‐crystal x‐ray diffraction study of the InGaAs‐GaAsP/GaAs superlattice system [Appl. Phys. Lett. 5 2, 1258 (1988)]
Rent:
Rent this article for
Access full text Article
/content/aip/journal/apl/53/6/10.1063/1.100420
1.
journal-id:
http://aip.metastore.ingenta.com/content/aip/journal/apl/53/6/10.1063/1.100420
Loading
/content/aip/journal/apl/53/6/10.1063/1.100420
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/53/6/10.1063/1.100420
1988-08-08
2014-07-31
Loading

Full text loading...

true
This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Erratum: Single‐crystal x‐ray diffraction study of the InGaAs‐GaAsP/GaAs superlattice system [Appl. Phys. Lett. 52, 1258 (1988)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/53/6/10.1063/1.100420
10.1063/1.100420
SEARCH_EXPAND_ITEM