No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Application of position sensitive atom probe to the study of the microchemistry and morphology of quantum well interfaces
1.H. X. Jiang and J. Y. Lin, J. Appl. Phys. 61, 624 (1987).
2.M. K. Miller and G. D. W. Smith, Atom Probe Microanalysis: Principles and Applications to Materials Science (to be published by the Materials Research Society).
3.A. Cerezo, T. J. Godfrey, and G. D. W. Smith, Rev. Sci. Instrum. 59, 862 (1988).
4.A. Cerezo, T. J. Godfrey, and G. D. W. Smith, J. Phys. (Paris) Colloq. 49, C6‐25 (1988).
5.J. A. Liddle, A. G. Norman, A. Cerezo, and C. R. M. Grovenor, J. Phys. (Paris) Colloq. 49, C6‐509 (1988).
6.G. L. Kellogg and T. T. Tsong, J. Appl. Phys. 51, 1184 (1980).
7.A. K. Petford‐Long (private communication).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month