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Rutherford backscattering spectroscopy and electron microprobe analyses of argon gas trapped in alumina thin films
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10.1063/1.101439
/content/aip/journal/apl/54/2/10.1063/1.101439
http://aip.metastore.ingenta.com/content/aip/journal/apl/54/2/10.1063/1.101439
/content/aip/journal/apl/54/2/10.1063/1.101439
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/content/aip/journal/apl/54/2/10.1063/1.101439
1989-01-09
2014-07-11
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Rutherford backscattering spectroscopy and electron microprobe analyses of argon gas trapped in alumina thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/54/2/10.1063/1.101439
10.1063/1.101439
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