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Electrical resistivity of thin epitaxial NiAl buried in (Al,Ga)As
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17.The observed rapid divergence of the ultrathin film resistivities cannot be explained in the context of the classical Fuchs' theory. This model would require a corresponding logarithmic decrease in the temperature coefficient of resistivity [see, for example, C. R. Tellier and A. J. Tosser, Size Effects in Thin Films (Elsevier, Amsterdam, 1982), pp. 102–104], which is contrary to the phonon resistivity measurements presented in Fig. 2.
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