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Use of surface charging in x‐ray photoelectron spectroscopic studies of ultrathin dielectric films on semiconductors
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10.1063/1.101450
/content/aip/journal/apl/54/4/10.1063/1.101450
http://aip.metastore.ingenta.com/content/aip/journal/apl/54/4/10.1063/1.101450
/content/aip/journal/apl/54/4/10.1063/1.101450
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/content/aip/journal/apl/54/4/10.1063/1.101450
1989-01-23
2015-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Use of surface charging in x‐ray photoelectron spectroscopic studies of ultrathin dielectric films on semiconductors
http://aip.metastore.ingenta.com/content/aip/journal/apl/54/4/10.1063/1.101450
10.1063/1.101450
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