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Low‐temperature measurement of the fundamental frequency response of a semiconductor laser by active‐layer photomixing
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10.1063/1.100890
/content/aip/journal/apl/54/7/10.1063/1.100890
http://aip.metastore.ingenta.com/content/aip/journal/apl/54/7/10.1063/1.100890
/content/aip/journal/apl/54/7/10.1063/1.100890
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/content/aip/journal/apl/54/7/10.1063/1.100890
1989-02-13
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low‐temperature measurement of the fundamental frequency response of a semiconductor laser by active‐layer photomixing
http://aip.metastore.ingenta.com/content/aip/journal/apl/54/7/10.1063/1.100890
10.1063/1.100890
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