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Characterization of reorientation of a thin layer of ferroelectric liquid‐crystal material under an applied field by excitation of optical modes
1.T. P. Rieker, N. A. Clark, G. S. Smith, D. S. Parmar, E. B. Sirota, and C. R. Safinya, Phys. Rev. Lett. 59, 2658 (1987).
2.S. J. Elston, J. R. Sambles, and M. G. Clark, J. Mod. Opt. 36, 1019 (1989).
3.K. R. Welford, J. R. Sambles, and M. G. Clark, Liq. Cry St. 2, 91 (1987).
4.Surface‐Plasmon Polaritons, IOP Short Meetings Series No. 9, edited by R. A. Innes and K. R. Welford (Institute of Physics, Bristol, UK, 1988).
5.D. W. Berreman and T. J. Scheffer, Phys. Rev. Lett. 25, 577 (1970).
6.R. M. A. Assam and N. M. Bashara, Ellipsometry and Polarised Light (North‐Holland, Amsterdam, 1979).
7.D. Y. K. Ko and J. R. Sambles, J. Opt. Soc. Amer. A 5, 1863 (1988).
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