1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Capture cross section of Si‐SiO2 interface states generated during electron injection
Rent:
Rent this article for
USD
10.1063/1.102397
/content/aip/journal/apl/55/2/10.1063/1.102397
http://aip.metastore.ingenta.com/content/aip/journal/apl/55/2/10.1063/1.102397
/content/aip/journal/apl/55/2/10.1063/1.102397
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/55/2/10.1063/1.102397
1989-07-10
2014-11-26
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Capture cross section of Si‐SiO2 interface states generated during electron injection
http://aip.metastore.ingenta.com/content/aip/journal/apl/55/2/10.1063/1.102397
10.1063/1.102397
SEARCH_EXPAND_ITEM