1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Full‐wafer mapping of total and ionized EL2 concentration in semi‐insulating GaAs using infrared absorption
Rent:
Rent this article for
USD
10.1063/1.102015
/content/aip/journal/apl/55/23/10.1063/1.102015
http://aip.metastore.ingenta.com/content/aip/journal/apl/55/23/10.1063/1.102015
Loading

Article metrics loading...

/content/aip/journal/apl/55/23/10.1063/1.102015
1989-12-04
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Full‐wafer mapping of total and ionized EL2 concentration in semi‐insulating GaAs using infrared absorption
http://aip.metastore.ingenta.com/content/aip/journal/apl/55/23/10.1063/1.102015
10.1063/1.102015
SEARCH_EXPAND_ITEM