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Interface atomic structure of Si/SiO2/Si formed by molecular beam deposition
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10.1063/1.102298
/content/aip/journal/apl/55/24/10.1063/1.102298
http://aip.metastore.ingenta.com/content/aip/journal/apl/55/24/10.1063/1.102298
/content/aip/journal/apl/55/24/10.1063/1.102298
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/content/aip/journal/apl/55/24/10.1063/1.102298
1989-12-11
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interface atomic structure of Si/SiO2/Si formed by molecular beam deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/55/24/10.1063/1.102298
10.1063/1.102298
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