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Structure of (√3×√3) R 30°‐B at the Si interface studied by grazing incidence x‐ray diffraction
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10.1063/1.102522
/content/aip/journal/apl/56/13/10.1063/1.102522
http://aip.metastore.ingenta.com/content/aip/journal/apl/56/13/10.1063/1.102522
/content/aip/journal/apl/56/13/10.1063/1.102522
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/content/aip/journal/apl/56/13/10.1063/1.102522
1990-03-26
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structure of (√3×√3) R 30°‐B at the Si interface studied by grazing incidence x‐ray diffraction
http://aip.metastore.ingenta.com/content/aip/journal/apl/56/13/10.1063/1.102522
10.1063/1.102522
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