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Sn incorporation into InP grown by molecular beam epitaxy: A secondary‐ion mass spectrometry study
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10.1063/1.102947
/content/aip/journal/apl/56/23/10.1063/1.102947
http://aip.metastore.ingenta.com/content/aip/journal/apl/56/23/10.1063/1.102947
/content/aip/journal/apl/56/23/10.1063/1.102947
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/content/aip/journal/apl/56/23/10.1063/1.102947
1990-06-04
2015-08-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sn incorporation into InP grown by molecular beam epitaxy: A secondary‐ion mass spectrometry study
http://aip.metastore.ingenta.com/content/aip/journal/apl/56/23/10.1063/1.102947
10.1063/1.102947
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