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In situ reflectivity monitoring of antireflection coatings on semiconductor laser facets through facet loss induced forward voltage changes
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10.1063/1.102920
/content/aip/journal/apl/56/24/10.1063/1.102920
http://aip.metastore.ingenta.com/content/aip/journal/apl/56/24/10.1063/1.102920
/content/aip/journal/apl/56/24/10.1063/1.102920
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/content/aip/journal/apl/56/24/10.1063/1.102920
1990-06-11
2014-12-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Insitu reflectivity monitoring of antireflection coatings on semiconductor laser facets through facet loss induced forward voltage changes
http://aip.metastore.ingenta.com/content/aip/journal/apl/56/24/10.1063/1.102920
10.1063/1.102920
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